Zwet, Willem Rutger van 1934-
Zwet, Willem R. van, 1934-
Zwet, W.R. van (Willem Rutger)
Zwet, Willem R. van 1934-2020
Willem van Zwet Nederlands wiskundige
Zwet, Willem Rutger van, 1934-2020
Zwet, Willem R van
Van Zwet, W. R.
VIAF ID: 68436525 ( Personal )
Permalink: http://viaf.org/viaf/68436525
Preferred Forms
- 100 1 _ ‡a Van Zwet, W. R.
- 100 0 _ ‡a Willem van Zwet ‡c Nederlands wiskundige
-
-
- 100 1 _ ‡a Zwet, Willem R. van, ‡d 1934-
-
-
- 100 1 _ ‡a Zwet, Willem R. van ‡d 1934-2020
-
-
- 100 1 _ ‡a Zwet, Willem Rutger van ‡d 1934-
- 100 1 _ ‡a Zwet, Willem Rutger van, ‡d 1934-2020
4xx's: Alternate Name Forms (30)
5xx's: Related Names (3)
- 551 _ _ ‡a Leiden ‡4 ortg ‡4 https://d-nb.info/standards/elementset/gnd#placeOfBirth
- 551 _ _ ‡a Leiden ‡4 ortw ‡4 https://d-nb.info/standards/elementset/gnd#placeOfActivity
- 510 2 _ ‡a Rijksuniversiteit Leiden ‡4 affi ‡4 https://d-nb.info/standards/elementset/gnd#affiliation ‡e Affiliation
Works
Title | Sources |
---|---|
Asymptotic expansions for the power of distributionfree tests in the two-sample problem | |
The Berry-Esseen bound for U-statistics | |
Convex transformations of random variables | |
Edgeworth expansions for asymptotically linear statistics | |
Generalized Markovian decision processes | |
Grondbegrippen van de waarschijnlijkheidsrekening | |
Het hachelijke oordeel | |
An inequality for random replacement sampling plans | |
No complaints so far | |
A non-Markovian model for cell population growth | |
On a set of the first category | |
On efficiency of first and second order | |
On estimating a parameter and its score function | |
On mixtures of distributions | |
On the combination of independent test statistics | |
On the edgeworth expansion for the logarithm of the likelihood ratio | |
Ranks and order statistics | |
A remark on consistent estimation | |
Resampling fewer than n observations: gains, losses, and remedies for losses | |
Selected works of Willem van Zwet | |
State of the art in probability and statistics, c2001: | |
Statistical estimation for the supercritical contact process |